한빛사 논문
Eunsung Seo1,2,5, Young-Ho Jin3,5, Wonjun Choi1,2, Yonghyeon Jo1,2, Suyeon Lee4, Kyung-Deok Song1,2, Joonmo Ahn1,2, Q.-Han Park2, Myung-Ki Kim3,* & Wonshik Choi1,2,*
1Center for Molecular Spectroscopy and Dynamics, Institute for Basic Science, Seoul 02841, Korea.
2Department of Physics, Korea University, Seoul 02841, Korea.
3KU-KIST Graduate School of Converging Science and Technology, Korea University, Seoul 02841, Korea.
4Samsung Advanced Institute of Technology, 130, Samsung-Ro, Yeongtong-Gu, Suwon, Gyeongi-Do 16678, Korea.
5These authors contributed equally: Eunsung Seo, Young-Ho Jin.
*Corresponding author
Abstract
As nanoscale photonic devices are densely integrated, multiple near-field optical eigenmodes take part in their functionalization. Inevitably, these eigenmodes are highly multiplexed in their spectra and superposed in their spatial distributions, making it extremely difficult for conventional near-field scanning optical microscopy (NSOM) to address individual eigenmodes. Here, we develop a near-field transmission matrix microscopy for mapping the high-order eigenmodes of nanostructures, which are invisible with conventional NSOM. At an excitation wavelength where multiple modes are superposed, we measure the near-field amplitude and phase maps for various far-field illumination angles, from which we construct a fully phase-referenced far- to near-field transmission matrix. By performing the singular value decomposition, we extract orthogonal near-field eigenmodes such as anti-symmetric mode and quadruple mode of multiple nano-slits whose gap size (50 nm) is smaller than the probe aperture (150 nm). Analytic model and numerical mode analysis validated the experimentally observed modes.
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