한빛사논문
Yeonwook Roh1,4, Hyeongseok Kim1,4, Eun-A Kim2,4, Kyungbin Ji1,4, Minji Kang1, Dohyeon Gong1, Sunghoon Im1, Insic Hong1, Jieun Park1, Soo Jung Park2, Yiseul Bae2, Jae-Il Park3, Je-Sung Koh1, Seungyong Han1, Eun Jeong Lee2 & Daeshik Kang1
1Multiscale Bioinspired Technology Lab, Department of Mechanical Engineering, Ajou University, Suwon-si, Gyeonggi-do, Republic of Korea.
2Molecular Neurocircuits Lab, Department of Brain Science, Ajou University School of Medicine, Suwon-si, Gyeonggi-do, Republic of Korea.
3Gwangju Center, Korea Basic Science Institute (KBSI), Gwangju, Republic of Korea.
4These authors contributed equally: Yeonwook Roh, Hyeongseok Kim, Eun-A Kim, Kyungbin Ji.
Corresponding authors
Correspondence to Eun Jeong Lee or Daeshik Kang.
Abstract
Bioelectronic implants in the deep brain provide the opportunity to monitor deep brain activity with potential applications in disease diagnostics and treatment. However, mechanical mismatch between a probe and brain tissue can cause surgical trauma in the brain and limit chronic probe-based monitoring, leading to performance degradation. Here, we report a transient shuttle-based probe consisting of a PVA and a mesh-type probe. A rigid shuttle based on PVA implants an ultrathin mesh probe in the target deep brain without a tangle, while creating both a sharp edge for facile penetration into the brain and an anti-friction layer between the probe and brain tissue through dissolving its surface. The capability to shuttle dissolved materials can exclude the retracted process of the shuttle in the brain. Complete dissolution of the shuttle provides a dramatic decrease (~1078-fold) in the stiffness of the probe, which can therefore chronically monitor a wide area of the brain. These results indicate the ability to use a simplistic design for implantation of wide and deep brain probes while preventing unnecessary damage to the brain and probe degradation during long-term use.
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